Objective Plate-Objective Plate-Ningbo Zhixing Optical Technology Co., Ltd.

Objective Plate

Product Series：Objective Plate

Comprehensive Material & Specification Selection Library ：

Diverse substrates, extensive size/thickness coverage, and customizable coatings.

Sub-100 nm Position Accuracy (Position Accuracy < 100 nm) ：

Tailored for high-end semiconductor inspection and precision metrology, Zhixing Optics pushes the boundaries of physical fabrication. Leveraging a laser direct writing system with 3-sigma < 50 nm, we strictly control the relative positional error between feature points to within 100 nm.

Ultra-High Resolution Fabrication Capability (Feature Size < 500 nm) ：

Capable of fabricating minimum feature sizes below 500 nm with exceptionally smooth pattern edges. This ensures that feature edges remain crisp and burr-free even under high-magnification objectives or high-pixel sensors, significantly enhancing the stability and accuracy of centroid localization algorithms.

Closed-Loop Comprehensive Solution Support ：

Expert-level selection guidance Full-chain engineering implementation High-precision fixture support Full-parameter performance verification

Material Overview
customization capability
Product Specifications
Usage

Material Overview	K9 Glass	B270 Glass	Fused Silica	Soda-Lime Glass
Advantages	• High surface flatness and excellent surface figure accuracy • >90% light transmittance; suitable for transmission calibration • Sharp and smooth pattern edges; easily achieves micron and sub-micron precision • Clear imaging	• High surface flatness and excellent surface figure accuracy • >90% light transmittance; suitable for transmission calibration • Sharp and smooth pattern edges; easily achieves micron and sub-micron precision • Clear imaging	• High surface flatness and excellent surface figure accuracy • >90% light transmittance; suitable for transmission calibration • Sharp and smooth pattern edges; easily achieves micron and sub-micron precision • Clear imaging • Extremely low sensitivity to temperature and humidity variations	• High surface flatness and excellent surface figure accuracy • >90% light transmittance; suitable for transmission calibration • Sharp and smooth pattern edges; easily achieves micron and sub-micron precision • Clear imaging
Disadvantages	• Standard optical glass is brittle; prone to edge chipping and fracture upon impact • Front illumination causes glare/reflections	• Standard optical glass is brittle; prone to edge chipping and fracture upon impact • Front illumination causes glare/reflections	• Standard optical glass is brittle; prone to edge chipping and fracture upon impact • Front illumination causes glare/reflections	• Standard optical glass is brittle; prone to edge chipping and fracture upon impact • Front illumination causes glare/reflections
Surface Process	Chrome Plating	Chrome Plating	Chrome Plating	Chrome Plating
Substrate Thickness	2.3 mm (Tolerance: ±0.1 mm) 3 mm / 4.8 mm (Tolerance: ±0.2 mm) 7.8mm	2.3 mm (Tolerance: ±0.1 mm) 3 mm / 4.8 mm (Tolerance: ±0.2 mm) 7.8mm	2.3 mm (Tolerance: ±0.1 mm) 3 mm / 4.8 mm (Tolerance: ±0.2 mm) 7.8mm	2.3 mm (Tolerance: ±0.1 mm) 3 mm / 4.8 mm (Tolerance: ±0.2 mm) 7.8mm
Surface Roughness (Ra)	≤0.05 μm (Mirror Grade)	≤0.05 μm (Mirror Grade)	≤0.05 μm (Mirror Grade)	≤0.05 μm (Mirror Grade)
Visible Light Transmittance	85%–95% (Transparent)	85%–95% (Transparent)	85%–95% (Transparent)	85%–95% (Transparent)
Coefficient of Thermal Expansion (CTE)	K9:7.1 × 10⁻⁶/℃	B270：9.4 × 10⁻⁶/℃	Fused Silica: 5.0–5.5 × 10⁻⁷/℃	Soda-Lime: 8.5–9.5 × 10⁻⁶/℃
Applicable Wavelength Range	UV Region: Only transmits near-UV (>350 nm); virtually opaque to deep UV (<300 nm). IR Region: IR cutoff at 2100–2200 nm; transmittance drops rapidly beyond this range. Visible Region (400–760 nm): Good transmittance.	UV Region Only transmits long-wave near-UV (>330 nm); virtually opaque below 300 nm. UV cutoff shifts toward longer wavelengths as thickness increases. Not suitable for UVB or deep-UV detection. IR Region: IR cutoff ~3050 nm. High and stable transmittance in the 780–2500 nm NIR band; gradual attenuation above 2500 nm. Visible Region (400–760 nm) Low-iron composition eliminates greenish tint; average visible transmittance 91%–92%.	UV Region: Transmits deep UV (down to 185 nm); ideal for UV light sources, lithography, and UV inspection. IR Region: Furthest IR cutoff (~3500 nm); higher and more stable NIR transmittance. Visible Region (400–760 nm): Slightly higher transmittance and lower dispersion.	UV Region: Earliest UV cutoff (~360 nm); essentially unsuitable for UV applications. IR Region: IR cutoff at 2100–2200 nm; transmittance drops rapidly beyond this range. Visible Region (400–760 nm): Good transmittance.
Hardness & Scratch Resistance	Mohs 5.5–6; Prone to scratching	Mohs 5.5–6; Prone to scratching	Mohs 5.5–6; Prone to scratching	Mohs 5.5–6; Prone to scratching
Optical Path Compatibility	Transmission + Reflection	Transmission + Reflection	Transmission + Reflection	Transmission + Reflection
Typical Applications	High-precision lab calibration, microscopic vision, transmission calibration	High-precision lab calibration, microscopic vision, transmission calibration	High-precision lab calibration, microscopic vision, transmission calibration	High-precision lab calibration, microscopic vision, transmission calibration

A stage micrometer is an absolute, high-precision calibration standard with physical dimensions traceable to national or industry standards. Its sole purpose is to serve as a "standard reference ruler" placed on the microscope stage to calibrate the scale factor of an eyepiece reticle or the pixel-to-distance ratio in microscope imaging software (e.g., measurement cameras).

Step 1: Cleaning and Placement

Surface Inspection: Before use, remove loose dust from the glass surface using an air blower bulb. If fingerprints are present, gently wipe in one direction using absorbent cotton moistened with a small amount of absolute ethanol. (Do not rub the etched area vigorously.)

Stage Placement: Place the stage micrometer on the microscope stage with the scale side facing up. Secure it with the stage clips so that its position is identical to that of a standard specimen slide.

Focusing: Focus sequentially from low to high magnification until high-contrast black scale lines are clearly visible in the center of the field of view (or on the monitor screen).

Step 2: Alignment and Calibration

Select the appropriate calibration method based on your measurement setup:

Option A: Manual Calibration with an Eyepiece Reticle

Rotate the eyepiece or move the stage until the "0" line of the eyepiece reticle aligns perfectly with the "0" line of the stage micrometer.

Look to the right to find the next point where the lines of both scales coincide exactly.

Calculate the single-division value:

Actual length per eyepiece division = Total actual length on stage micrometer within the interval / Total number of eyepiece divisions within the interval

Option B: Digital Calibration with Microscope Measurement Software / Industrial Camera

Open the "New Calibration" module in the microscope imaging software.

Draw a digital measurement line (or crosshair box) on the screen and align it precisely with a known length segment on the stage micrometer (e.g., a 1 mm section).

Enter the actual physical dimension of this segment in the software dialog box (e.g., input 1000 micrometers).

Click Save. The system will automatically convert the current "pixel count" into "actual micrometers," completing the scale setting.

Step 3: Removal and Sample Replacement

After calibration is complete, remove the stage micrometer from the stage and return it to its dust-proof storage case.

Without changing the microscope objective magnification, camera resolution, or zoom focal length, place the actual specimen slide to be measured onto the stage.

At this point, multiply the number of divisions read on the eyepiece reticle (or the line drawn in the software) by the calibration factor determined in Step 2 to obtain the true physical dimension of the specimen.

Strict Maintenance and Storage Precautions

Never change objective magnification during calibration: Every time the objective lens is changed (e.g., from 10× to 40×), the stage micrometer must be placed back on the stage for recalibration.

Moisture-proof, mold-proof, and scratch-proof: Stage micrometers are manufactured using high-precision physical etching processes. After use, they must be promptly returned to a dry, sealed, dedicated protective case. Strictly avoid contact with hard objects or chemical acid/alkali reagents.

Home

About Us

About Us

Products

Products

Contact Us

Contact Us

Objective Plate

Quick Link

Product category

Contact Us